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DEPARTMENT OF PHYSICS AND
ASTRONOMY
LINKS
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Additional Experimental Facilities
In
addition to the more specialized techniques such as inverse
photoemission, APECS, and scanning probe microscopy, our lab also
has a wide array of more conventional surface analytical techniques
including Auger electron spectroscopy (AES), low energy electron
diffraction (LEED), and temperature programmed desorption (TPD).
Other, more extensive in-house capabilities are also available
through the Laboratory for Surface
Modification. These include a 2-MeV tandetron accelerator for
Rutherford backscattering spectrometry, a 250 keV ion accelerator
for medium energy ion scattering (MEIS) and a Kratos 6000 multiprobe
for x-ray photoemission spectroscopy (XPS), low energy ion
scattering (LEIS) and Auger electron spectroscopy (AES) as well as
depth profiling.
While our APECS activities are located at the
National Synchrotron Light Source
(NSLS) of Brookhaven National
Laboratory (BNL), where we are PRT members of the U16 beamline,
we also perform soft x-ray absorption spectroscopy (SXAS) and
magnetic circular dichroism (XMCD) measurements on U4B, and are
users of the Brookhaven Center for
Functional Nanomaterials (CFN). Other off-campus research
activities include performing high resolution photoemission
spectroscopy measurements at the
Advanced Light Source (ALS). |
Related Sites of Interest
Recent Publications
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Room temperature ferromagnetism in Mn ion
implanted epitaxial ZnO films
D.H.Hill, D.A. Arena,
R.A. Bartynski, P. Wu, G. Saraf, Y. Lu, Wielunski, R. Gateau, J.
Dvorak, A. Moodenbaugh, and Y.K. Yeo, Physica Status Solidi A,
203, 3836 (2006)
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Ferromagnetism in Fe-implanted a-plane ZnO
Films
D.P. Wu, G. Saraf, Y. Lu, D.H. Hill, D.A. Arena, R.A. Bartynski, L.
Wielunski, R. Gateau, J. Dvorak, A. Moodenbaugh, T. Siegrist, J.
A. Raley, and Yung Kee Yeo, Appl. Phys. Lett.89, 12508
(2006)
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The relation between crystalline phase,
electronic structure, and dielectric properties in high-k gate
stacks
S.
Sayan, M. Croft, N.C. Nguyen, T. Emge, J. Ehrstein, I. Levin, J.
Suehle, R.A. Bartynski, and E. Garfunkel, AIP Conf. Proc. 788,
92 (2005)
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Dichroic effects in Auger-photoelectron
coincidence spectroscopy of solids
R.
Gotter, F. Da Pieve. A. Ruocco, F. Offi, G. Stefani, R.A.
Bartynski, Phys. Rev. B. 72, 235409 (2005)
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Inverse Photoemission Spectroscopy from
Al(100)
J. F. Veyan, W. Ibanez, R.A.
Bartynski, P Vargas, and P. Haberle, Phys. Rev. B. 71,
155416 (2005)
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