Olivier Guise+, Hubertus Marbach+,
Jeremy Levy#, John T. Yates, Jr. +#, Joachim Ahner*
Center for Oxide Semiconductor Materials for Quantum
Computation
Department of Chemistry+ Department of Physics#
Tel: 412-624-8420, FAX: 412-624-6003
It is well appreciated, that as
the size of material objects approaches nanometer dimensions, the materials
structural and electronic properties change. The investigation of these effects
forms a broad active area of current research aimed at the optimization of
nanometer sized materials properties for use in a large field of technologies
including electronic devices and high-density data storage.
We report the development of
novel subnanometer manipulative and analytical devices for imaging, chemically
analyzing and manipulation of nanometer scaled material. Two different versions
of the nanoworkbench are operating currently at the
We report first results obtained
by using both versions of the nanoworkbench, where we succeeded in writing
patterns of ultra-small carbon-containing dots (8nm in diameter) with high
position accuracy (<5nm) by electron-beam-induced dissociation of carbon
containing background gases. In parallel studies, the electron-stimulated
carbon film creation on Si(100) using various pure hydrocarbon gases was
studied in UHV by AES, TPD and XPS. The thermal stability of the carbon film
and dots has been studied over the temperature range from 300K - 1400K, where
the carbon converts to SiC, giving high thermal stability. We are planning to
use these carbon templates for the growth of germanium quantum dots, important
for the development of novel quantum electronic devices.
This
work was supported by DARPA QuIST through ARO contract number
DAAD-19-01-1-0650.