| The Laboratory for Surface Modification (LSM) at Rutgers is home to a Kratos XSAM 800 Surface Analysis System, which is operated as an ESCA facility for the NJCBMD. This ESCA system includes a surface preparation chamber, a surface analysis chamber, and sample transfer capabilities. The heart of the analysis chamber is a 100 mm radius concentric hemispherical analyzer (CHA) with a multichannel detector system. Photoelectrons ejected from a sample surface by x-rays from a Mg Ka (or Al Ka) source are energy-analyzed and detected using this CHA. The CHA can also be used for low energy ion scattering spectroscopy, another surface analysis tool. A Unix-based system for spectrometer control and data analysis has recently been installed. |
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