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| A side view of half of the CDF Run II silicon system on a scale in which the Z coordinate is highly compressed. | An end view of the CDF II silicon system including the SVX II cooling bulkheads and ISL support structure. | A graduate student at Rutgers, inspecting a Layer 4 ladder. The optical inspection of finished detectors spots flaws in fabrication before testing and burnin. | The Rutgers HEX Computer Farm is used by Physicists at Rutgers and around the world to run analysis jobs. |
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| Faculty: | ||||
| Devlin, Thomas J. | Watts, Terence | Somalwar, Sunil | Lath, Amit | Halkiadakis, Eva |
| Postdocs: | Anastassov, Anton | Chuang, Sunny | ||
| Students: | ||||
| Dube, Sourabh | Yamaoka,Jared | Hare, Daryl | ||
| Staff: | ||||
| Jacques, Pieter | Doroshenko, John |